Intel® Solid-State Drive 535 Series (2.5-inch)
April 2015 Product Specification
332062-002US 23
5.8 SMART Attributes
The following two tables list the SMART attributes supported by the Intel SSD 535 Series, and the corresponding
status flags and threshold settings.
Table 21: SMART Attributes
Re-allocated Sector Count
The raw value of this attribute shows the
number of retired blocks since leaving the
factory (grown defect count).
Power-On Hours Count
The raw value reports two values: the first
4 bytes report the cumulative number of
power-on hours over the life of the device,
the remaining bytes report the number of
milliseconds since the last hour increment.
The On/Off status of the Device Initiated
Power Management (DIPM) feature will
affect the number of hours reported. If DIPM
is turned On, the recorded value for
power-on hours does not include the time
that the device is in a "slumber" state. If
DIPM is turned Off, the recorded value for
power-on hours should match the clock
time, as all three device states are counted:
active, idle and slumber.
Power Cycle Count
The raw value of this attribute reports the
cumulative number of power cycle events
over the life of the device.
Program Fail Count
The raw value of this attribute shows total
count of program fails and the normalized
value, beginning at 100, shows the percent
remaining of allowable program fails.
Erase Fail Count
The raw value of this attribute shows total
count of erase fails and the normalized
value, beginning at 100, shows the percent
remaining of allowable erase fails.
Unexpected Power Loss
The raw value of this attribute reports the
cumulative number of unsafe (unclean)
shutdown events over the life of the device.
An unsafe shutdown occurs whenever the
device is powered off without STANDBY
IMMEDIATE being the last command
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